IEEE International Reliability Physics Symposium (IRPS 2027)

The IEEE International Reliability Physics Symposium (IRPS 2027) advances knowledge and practices in microelectronic device reliability, covering device physics, failure analysis, and system-level dependability.

Key Topics

• Gate dielectrics
• Transistors
• Compound/optoelectronics
• Beyond CMOS devices
• Process integration
• Back-end reliability
• Memory
• Failure analysis
• MEMS
• Photovoltaics
• Circuit aging simulations
• Circuit reliability
• Consumer electronics reliability
• Product IC reliability
• Soft errors
• Electronic system reliability
• 3D assembly
• ESD and latchup
• Packaging

Who should Attend

• Scientists in microelectronics reliability
• Engineers in semiconductor device reliability
• Researchers in device physics and failure analysis
• Professionals in electronic system dependability
• MEMS and photonics reliability specialists
• Industry leaders in consumer electronics and IC products