The IEEE International Reliability Physics Symposium (IRPS 2027) advances knowledge and practices in microelectronic device reliability, covering device physics, failure analysis, and system-level dependability.
Key Topics
Gate dielectrics
Transistors
Compound/optoelectronics
Beyond CMOS devices
Process integration
Back-end reliability
Memory
Failure analysis
MEMS
Photovoltaics
Circuit aging simulations
Circuit reliability
Consumer electronics reliability
Product IC reliability
Soft errors
Electronic system reliability
3D assembly
ESD and latchup
Packaging
Who should Attend
Scientists in microelectronics reliability
Engineers in semiconductor device reliability
Researchers in device physics and failure analysis
Professionals in electronic system dependability
MEMS and photonics reliability specialists
Industry leaders in consumer electronics and IC products
IEEE International Reliability Physics Symposium (IRPS 2027) - 2027, United States (12526)
Past Events
IEEE International Reliability Physics Symposium (IRPS 2026) - 22-26 Mar 2026, Loews Ventana Canyon, Tucson, Arizona, United States (549)
IEEE International Reliability Physics Symposium (IRPS 2025) - 30 Mar - 03 Apr, 2025, Hyatt Regency Monterey Resort & Spa, California, United States (24155)
IEEE International Reliability Physics Symposium (IRPS 2024) - 14-18 Apr 2024, Hilton DFW Lakes Executive Conference Center, Grapevine, Texas, United States (24154)
Important
Please, check "IEEE International Reliability Physics Symposium (IRPS)" official website for possible changes, before making any traveling arrangements
