3rd EOS Conference on Manufacturing of Optical Components (EOSMOC 2013)

The 3rd EOS Conference on Manufacturing of Optical Components (EOSMOC 2013) is dedicated to all aspects of optics fabrication and testing, ranging from micro to large-scale optics and from high value one-off to mass-produced components. Sessions included in the event are:

• Latest Advances in Freeform Optics
  
  • Freeform optics design theory and method
  • Alignment processes and systems for complex optical systems
  • Processes and machines for freeform optical elements
  • Freeform optics application in optical imaging and lighting system
  • Monolithic optics
  • Freeform surface descriptions, optimization algorithms and techniques
  • Data exchange chain for freeform production
• High-Volume Manufacturing of Optical Components
  
  • Glass molding
  • Wafer level optics
  • Optical design for molded optics
  • Polymer molding
  • Modules made from molded optics
• Precise Optics Fabrication
  
  • Lasers as manufacturing tools
  • Abrasive processes and machines
  • Diamond machining and machines
  • Local polishing and figuring techniques
  • Reflection and diffraction hybrid optical element and system technology
• Micro-Optics and Structured Surfaces
  
  • Manufacturing technologies: mastering, tooling, replication
  • Μ-optics for illumination systems and laser beam shaping
  • Diffractive optics element design and fabrication
  • Lithographic processing and etching
  • Smart micro-optics incl. multilayered coatings
  • Μ-optics on curved substrates
  • Fabrication and packaging of micro-optical components
  • Gratings and holographic optical elements
  • Micro-optics in display and spectroscopy
  • Characterization of micro-optical elements
  • Gratings / µ-optics with low stray light
  • Integration of silicon and glass-based components
  • Nanoimprint lithography
  • Micro-texturing technologies
  • Plastic (organic electronics) imprint technologies
• Testing for Fabrication and Assembly
  
  • Measurement of micro-structured surfaces for optical element fabrication
  • Measurement of aspheric and freeform optical surfaces
  • Calibration of measurements on high precision optical surfaces
  • In-process/in-machine measurement for improved optical production
  • Metrology for wafer level assembly processes
  • Generation and measurement of fiducials over the whole production chain
  • Metrology tools for assembly and alignment
  • Structured surfaces and optical film measurement