6th EOS Topical Meeting on Advanced Imaging Techniques (AIT 2013)
2013 (No final dates)
Location is not final
The EOS Topical Meeting on Advanced Imaging Techniques (AIT) is a conference that covers topics such as:
- Structured light illumination (SIM)
- Numerical image restoration
- Superresolving pupil-masks
- Fluorescence superresolution techniques (STORM, FRED, PALM, STED)
- Double and quadruple patterning lithography
- Nonlinear imaging
- Advanced nearfield methods (lenlets, metamaterials...)
- Exoplanet detection
- Superresolution radar
Exhibition
No exhibition
Organization
Website
Important
Please, check the conference website for possible changes, before you make any traveling
arrangements
* Prices are for evaluation only.
Articles/News/Press releases
