International Test Conference (ITC 2026)

International Test Conference (ITC 2026) is a conference dedicated to electronic test of boards, devices and systems.

Key Topics

• Adaptive Test in Practice
• 3D/2.5D Test
• Advances in Boundary Scan
• ATE/Probe Card Design
• Data Driven Methods
• Bring Up
• Defect-Oriented Testing
• Data Exchange and Infrastructure
• Diagnosis
• DFM and Test
• End-to-End Data Analysis
• Economics of Test
• Emerging Defect Mechanisms
• Embedded BIST & DFT
• IoT Testing
• Hardware Security and Trust
• Known-Good-Die testing
• Jitter, High-Speed I/O and RF Test
• MEMS Testing
• Memory Test and Repair
• New Technologies and Test
• Mixed-Signal and Analog Test
• Online Test
• On-Chip Test Compression
• Power Issues in Test
• Pre- and Post- Silicon Validation
• Reliability and Resilience
• Protocol-aware Test
• SoC/SiP/NoC Test
• Scan Based Test
• Simulation and Test
• Silicon Debug
• System Test (Hardware/Software)
• System Test (Applications)
• Test Escape Analysis
• Test-to-Design Feedback
• Test Generation and Validation
• Test Flow Optimizations
• Test Standards
• Test Resource Partitioning
• Testing High Speed Optics/Photonics
• Test Time Analysis and Reduction
• Yield Analysis and Optimization
• Timing Test

Who should Attend

Test and design professionals.