21st International Conference on Microscopy of Semiconducting Materials (MSM-XXI 2019)

The 21st International Conference on Microscopy of Semiconducting Materials (MSM-XXI 2019) is dedicated to progress in the diffraction, imaging and spectroscopy of inorganic and hybrid perovskite semiconductor nanostructures used in (opto)electronic and photonic devices, as well as interfaces of thin dielectric, metal or polymer films to such semiconductors.

The 21st International Conference on Microscopy of Semiconducting Materials (MSM-XXI 2019) covers topics such as:

• In situ and in operando microscopy techniques
• Atom Probe Techniques
• Quantum wells and strained layer epitaxy
• Lattice defects in bulk materials
• Scanning electron and ion beam techniques
• Quantum wires and quantum dots