International Test Conference (ITC 2024)

  • 03-08 Nov 2024
  • Hilton San Diego Bayfront, CA, United States

Description

International Test Conference (ITC 2024) is a conference dedicated to electronic test of boards, devices and systems.

International Test Conference (ITC 2024) covers topics such as:

  • Adaptive Test in Practice
  • 3D/2.5D Test
  • Advances in Boundary Scan
  • ATE/Probe Card Design
  • Data Driven Methods
  • Bring Up
  • Defect-Oriented Testing
  • Data Exchange and Infrastructure
  • Diagnosis
  • DFM and Test
  • End-to-End Data Analysis
  • Economics of Test
  • Emerging Defect Mechanisms
  • Embedded BIST & DFT
  • IoT Testing
  • Hardware Security and Trust
  • Known-Good-Die testing
  • Jitter, High-Speed I/O and RF Test
  • MEMS Testing
  • Memory Test and Repair
  • New Technologies and Test
  • Mixed-Signal and Analog Test
  • Online Test
  • On-Chip Test Compression
  • Power Issues in Test
  • Pre- and Post- Silicon Validation
  • Reliability and Resilience
  • Protocol-aware Test
  • SoC/SiP/NoC Test
  • Scan Based Test
  • Simulation and Test
  • Silicon Debug
  • System Test (Hardware/Software)
  • System Test (Applications)
  • Test Escape Analysis
  • Test-to-Design Feedback
  • Test Generation and Validation
  • Test Flow Optimizations
  • Test Standards
  • Test Resource Partitioning
  • Testing High Speed Optics/Photonics
  • Test Time Analysis and Reduction
  • Yield Analysis and Optimization
  • Timing Test

International Test Conference (ITC 2024) brings together test and design professionals.

Venue

  • Hilton San Diego Bayfront , 1 Park Boulevard, San Diego, California, United States

More Details

Prices:
120-500 US Dollar (Estimated)
Organizer:
IEEE
Website:

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Important

Please, check "International Test Conference (ITC)" official website for possible changes, before making any traveling arrangements

Event Categories

Science: Engineering
Technology: Equipment & machinery

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