Introduction to Industrial Statistics 2017 covers topics such as:
- Basic statistics: measurements of central tendency and variation
- How variation and accuracy affect quality; your process as a musket or a rifle
- Statistical hypothesis testing; null and alternate hypothesis, and associated risks
- Compound events (and/or relationships) and application to series and parallel reliability and rolled throughput yield (RTY)
- The normal or bell curve distribution
- Discrete (attribute) data distributions: hypergeometric, binomial, and Poisson distributions
- X chart for individual measurements
- Control charts (SPC)
- Measurement System Analysis (MSA), or gage reproducibility and repeatability
Introduction to Industrial Statistics 2017 brings together attendees from:
- Managers, and Technicians
- Manufacturing Engineers
