The 3rd EOS Conference on Manufacturing of Optical Components (EOSMOC 2013) is dedicated to all aspects of optics fabrication and testing, ranging from micro to large-scale optics and from high value one-off to mass-produced components. Sessions included in the event are:
- Latest Advances in Freeform Optics
- Freeform optics design theory and method
- Alignment processes and systems for complex optical systems
- Processes and machines for freeform optical elements
- Freeform optics application in optical imaging and lighting system
- Monolithic optics
- Freeform surface descriptions, optimization algorithms and techniques
- Data exchange chain for freeform production
- High-Volume Manufacturing of Optical Components
- Glass molding
- Wafer level optics
- Optical design for molded optics
- Polymer molding
- Modules made from molded optics
- Precise Optics Fabrication
- Lasers as manufacturing tools
- Abrasive processes and machines
- Diamond machining and machines
- Local polishing and figuring techniques
- Reflection and diffraction hybrid optical element and system technology
- Micro-Optics and Structured Surfaces
- Manufacturing technologies: mastering, tooling, replication
- Μ-optics for illumination systems and laser beam shaping
- Diffractive optics element design and fabrication
- Lithographic processing and etching
- Smart micro-optics incl. multilayered coatings
- Μ-optics on curved substrates
- Fabrication and packaging of micro-optical components
- Gratings and holographic optical elements
- Micro-optics in display and spectroscopy
- Characterization of micro-optical elements
- Gratings / µ-optics with low stray light
- Integration of silicon and glass-based components
- Nanoimprint lithography
- Micro-texturing technologies
- Plastic (organic electronics) imprint technologies
- Testing for Fabrication and Assembly
- Measurement of micro-structured surfaces for optical element fabrication
- Measurement of aspheric and freeform optical surfaces
- Calibration of measurements on high precision optical surfaces
- In-process/in-machine measurement for improved optical production
- Metrology for wafer level assembly processes
- Generation and measurement of fiducials over the whole production chain
- Metrology tools for assembly and alignment
- Structured surfaces and optical film measurement
