33rd International Conference on Microelectronic Test Structures (ICMTS)

  • 6-9 April 2020
  • Edinburgh, United Kingdom

The 33rd International Conference on Microelectronic Test Structures (ICMTS) is a conference dedicated to:

  • Test structure implementation
  • New developments in test structures
  • Compound semiconductor
  • Application in the fields of silicon
  • MEMS research
  • Nanotechnology
  • Test structures aimed at the characterization of new materials and devices

The 33rd International Conference on Microelectronic Test Structures (ICMTS) will be held in Edinburgh, United Kingdom on 6-9 April 2020.

Venue

Edinburgh,
United Kingdom
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IEEE
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Past and Future Events

  • 34th International Conference on Microelectronic Test Structures (ICMTS) - 2021 (19725)
  • 33rd International Conference on Microelectronic Test Structures (ICMTS) - 6-9 Apr 2020, Edinburgh, United Kingdom (35099)
  • 32nd International Conference on Microelectronic Test Structures (ICMTS 2019) - 18-21 Mar 2019, Kitakyushu, Japan (19733)

Important

Please, check the official conference website for possible changes, before you make any traveling arrangements

Prices are for evaluation only.

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