33rd International Conference on Microelectronic Test Structures (ICMTS)
- 6-9 April 2020
- Edinburgh, United Kingdom
The 33rd International Conference on Microelectronic Test Structures (ICMTS) is a conference dedicated to:
- Test structure implementation
- New developments in test structures
- Compound semiconductor
- Application in the fields of silicon
- MEMS research
- Nanotechnology
- Test structures aimed at the characterization of new materials and devices
The 33rd International Conference on Microelectronic Test Structures (ICMTS) will be held in Edinburgh, United Kingdom on 6-9 April 2020.
Past and Future Events
- 34th International Conference on Microelectronic Test Structures (ICMTS) - 2021 (19725)
- 33rd International Conference on Microelectronic Test Structures (ICMTS) - 6-9 Apr 2020, Edinburgh, United Kingdom (35099)
- 32nd International Conference on Microelectronic Test Structures (ICMTS 2019) - 18-21 Mar 2019, Kitakyushu, Japan (19733)
Important
Please, check the official conference website for possible changes, before you make any traveling arrangements
Prices are for evaluation only.