SPIE Optical Metrology 2013 is a conference focused on the role of Laser technology and cover the following topics:
- Modeling Aspects in Optical Metrology
- Optical Measurement Systems for Industrial Inspection
- Range Imaging, Videometrics and Applications
- Optics for Architecture, Arts and Archaeology
- Automated Visual Inspection
- Optical Methods for Characterization, Inspection and Imaging of Biomaterials
SPIE Optical Metrology 2013 brings together:
- Engineers
- Scientists
- Product developers
- Researchers
