XTOP - The Biennial Conference on High-Resolution X-Ray Diffraction and Imaging

XTOP - The Biennial Conference on High-Resolution X-Ray Diffraction and Imaging is dedicated to phase contrast imaging, synchrotron-based high-resolution X-ray diffraction methods and micro-tomography. Topics include:

  • Applications
    • Nanomaterials/Nanoscience
    • Material science (single crystals, heterostructures, surface and interfaces)
    • Non destructive testing (including industrial needs and cultural heritage)
    • Biomedical
  • Methods & Techniques
    • Phase contrast imaging
    • X-ray topography
    • High resolution XRD
    • Standing wave technique
    • Grazing Incidence diffraction
    • Microdiffraction
    • Time resolved diffraction
    • X-ray reflectometry, SAXS/GISAXS
    • Resonant (anomalous) scattering
    • Coherent imaging (incl. SAXS, Bragg CDI, X-ray Holography)
    • Theory of X-ray diffraction in crystals
    • Fast tomography
  • Instruments
    • New developments for laboratory diffractometry and imaging
    • X-ray optics and instrumentation
    • X-ray Free-Electron Lasers

XTOP - The Biennial Conference on High-Resolution X-Ray Diffraction and Imaging brings together scientists from the fields of:

  • Reflectometry
  • X-ray diffractometry
  • Coherent and conventional X-ray diffraction imaging
  • Standing waves
  • X-ray phase contrast imaging (radiography and micro- tomography)
  • Topography

Important

Please, check the official conference website for possible changes, before you make any traveling arrangements

Prices are for evaluation only.

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