The 103rd ARFTG Microwave Measurement Conference is dedicated to topics related to RF and microwave measurement techniques.
The 103rd ARFTG Microwave Measurement Conference covers topics such as:
- EM characterization, incl. de-embedding, of materials and biological samples
- Calibration and characterization, incl. cryogenic, for quantum technology
- Waveguide and free-space subTHz and THz measurements
- On-wafer measurements of RF to subTHz devices and circuits
- Nonlinear characterizations, incl. linearization, of devices, circuits, and systems
- Generation and measurement of sub-THz signals with wideband modulation
- Other recent developments in metrology incl. measurement uncertainty
- Over the air (OTA) calibration and measurement for 5G/6G and Internet of Things (IoT)
