57th IEEE Semiconductor Interface Specialists Conference (SISC 2026)

The 57th IEEE Semiconductor Interface Specialists Conference (SISC 2026) examines semiconductor materials, interfaces, dielectric technologies, device performance, and reliability research.

Key Topics

• Oxide and interface chemistry, structure, passivation and defects
• Insulators on high-mobility and alternative substrates
• SiO2 and high-k dielectrics on Si and their interfaces
• Stacked dielectrics for non-volatile memory
• MOS gate stacks with metal gate electrodes
• Electrical characterization, performance and reliability of MOS-based devices
• Dielectrics on nanowires, nanotubes, and graphene
• Surface cleaning technology and impact on dielectrics and interfaces
• Interfaces in photovoltaics
• Oxide electronics and multiferroics

Who should Attend

Solid-state physicists, device engineers and materials scientists.