ICMTS aims to bring together designers and users of microelectronic test structures. We cover new developments in test structures related to microelectronic, nanotechnology and MEMS research. This includes their implementation, and applications as well as test structures aimed at the characterisation of new materials and devices.
Past Events
2011 International Conference on Microelectronic Test Structures (ICMTS) - 04-07 Apr 2011, Royal Netherlands Academy of Arts and Sciences (Koninklijke), Amsterdam, Netherlands (12276)
International Conference on Microelectronic Test Structures (ICMTS) 2026
Important
Please, check "International Conference on Microelectronic Test Structures (ICMTS)" official website for possible changes, before making any traveling arrangements