XTOP 2014 - The 12th Biennial Conference on High-Resolution X-Ray Diffraction and Imaging

XTOP 2014 - The 12th Biennial Conference on High-Resolution X-Ray Diffraction and Imaging is dedicated to phase contrast imaging, synchrotron-based high-resolution X-ray diffraction methods and micro-tomography. Topics include:

• Applications
  • Nanomaterials/Nanoscience
  • Material science (single crystals, heterostructures, surface and interfaces)
  • Non destructive testing (including industrial needs and cultural heritage)
  • Biomedical
• Methods & Techniques
  • Phase contrast imaging
  • X-ray topography
  • High resolution XRD
  • Standing wave technique
  • Grazing Incidence diffraction
  • Microdiffraction
  • Time resolved diffraction
  • X-ray reflectometry, SAXS/GISAXS
  • Resonant (anomalous) scattering
  • Coherent imaging (incl. SAXS, Bragg CDI, X-ray Holography)
  • Theory of X-ray diffraction in crystals
  • Fast tomography
• Instruments
  • New developments for laboratory diffractometry and imaging
  • X-ray optics and instrumentation
  • X-ray Free-Electron Lasers

Who should Attend

Scientists from the fields of:

• Reflectometry
• X-ray diffractometry
• Coherent and conventional X-ray diffraction imaging
• Standing waves
• X-ray phase contrast imaging (radiography and micro- tomography)
• Topography