11th Inter-American Congress on Electron Microscopy (CIASEM 2011) 2026 2027 (8144)

Topics

Instrumentation and Methodology

Advanced techniques for atomic resolution (electron optics, electron optical elements, holography, phase retrieval, aberration correction, )
High resolution TEM and STEM
Quantitative electron diffraction techniques ( CBED, EBSD,..)
Analytical TEM ( EELS, EFTEM, )
Advances in SEM and HR-SEM
Advances in optical (NSOM, confocal) probes
Advances on scanning probe microscopy (STM, AFM, bimodal, EFM, SKPM)
3D-Imaging and nanotomography
Advances in sample preparation techniques
Environmental microscopy
X-ray Microscopy, ion microscopy, etc.
Advanced image analysis methods

Materials science

Materials for nanotechnology (nanowires, nanotubes, nanoparticles, nanostructured materials)
Carbon based materials
Semiconductors and magnetic materials
Thin films, coatings, surfaces and interfaces
Metal alloys and intermetallics
Ceramics, composites, minerals and self-assembled materials
Polymers and soft materials
Microscopy in environment and cultural heritage
Forensic applications
Microscopy on devices

Life Sciences

Plenary lectures, Symposium, Poster sessions, Workshops

Trade Exhibition

11th Inter-American Congress on Electron Microscopy (CIASEM 2011)